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Scanning Electron Microscopy Facilities

Intellection Quemscan
This instrument is an automated mineral analysis system based on a Zeiss EVO 50 scanning electron microscope. Four EDS detectors are used simultaneously to rapidly determine the mineral phases in a polished section of rock. Sophisticated software differentiates the mineral from the mounting resin so that analysis time is devoted only to the rock itself. The results are visually presented in colour-coded mineral maps, which are readily interpreted by mineralogists and process metallurgists. With the four EDS detectors, the instrument can analyse up to 200 points per second, making it a serious tool for improving productivity in the analysis of rocks in geoscience research and the mining industry.

Specialist: Dr Peter Hines

   Intellection Quemscan
   

Zeiss ULTRA plus

  • Schottky field-emission source for high resolution and beam current.
  • Exceptional low kV performance.
  • Topgraphic imaging to < 1nm by efficient in-lens detector.
  • High-resolution orientation and strain imaging by AsB detector.
  • Nanoscale, high-sensitivity compositional imaging using EsB detector and limiting grid.
  • Charge compensator (gas injector) for imaging of non-conducting specimens.
  • Bruker XFlash 4010 EDS detector with high sped acquisition and  hypermapping capability.
  • High-current mode for extended depth of field and EBSD.
  • HKL Nordlys 2 EBSD system for orientation mapping.
  • STEM detector with brightfield and darkfield imaging.

Specialists: Dr Peter Hines, Dr Julie Cairney, Dr Ian Kaplin

   Zeiss ULTRA plus
   

FEI Quanta 200 3D
Computer controlled SEM with totally automated 5-axis specimen stage; high vacuum, low vacuum and ESEM modes enable charge-free imaging and analysis of non-conductive specimens; Focused Ion Beam (FIB) for subsurface characterisation of specimens and preparation of thin sections; EDAX Genesis 4000 Super Ultra-Thin Window EDS microanalysis system for detection of all elements down to and including Beryllium. A Renishaw Raman inVia Reflex Microscope with 5 laser lines interfaces to the Quanta allowing secondary electron imaging and Raman spectroscopic analysis from the same region of a sample located in the SEM chamber.

Specialists: Dr Peter Hines, Dr Julie Cairney, Dr Ian Kaplin

   FEI Quanta 200 3D
   

Philips XL 30 CP
Computer controlled SEM with automated specimen stage; ultra-thin window EDS microanalysis; X-ray mapping; Controlled pressure.

Example image:
Radiolarian from the Eocene era (c 45 million years ago). The small calcite star-shaped object is a discoaster, a marine phytoplankton.

Specialists: Dr Peter Hines, Dr Ian Kaplin

   Philips XL 30 CP

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